A New Noise Parameter Measurement Method For Microwave Devices - Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceeedings. 'Qu

This paper proposes a new method fo r noise parameter measurement of microwave devices. Instead of measuring the noise figure, the optimum source impedance r o p t is determined by measuring the noise powers corresponding to cold impedances, then the minimum noise figure Fmn ( 0 r minimum effective noise temperature T,,,) and noise conductance Gn are determined by connecting a calibrated hot noise source. The measurements corresponding to the largest possible range of the source impedance reflection coefficient is possible 0 5 r 5 1 which is not the case of the classical method. Automatic tuner and isolators used in the c lassical method [I], [2] are no more necessary. Using our method, noise measurement system cost will be reduced and measurement time will also be minimized.